Electron Microscopes and Focused Ion Beam

Hitachi’s scientific research equipment caters to the needs of diverse scientific fields, ranging from medical and biological research, to industrial manufacturing and materials science. Our product offerings include Scanning Electron Microscopes (SEM), dedicated Scanning Transmission Electron Microscopes (STEM), analytical and biological Transmission Electron Microscopes (TEM), Focused Ion Beam (FIB), and micro analysis sample preparation systems. The scanning electron microscopes are also available as tabletop microscopes for convenience and enhanced usability.

Electron Microscopes (SEM/TEM/STEM)

Electron Microscopes (SEM/TEM/STEM)

Hitachi has proven itself as the world leader in the design, development, and delivery of sophisticated, advanced, and premium quality electron microscopes. These include Scanning Electron Microscopes (SEM), Transmission Electron Microscopes (TEM), Scanning Transmission Electron Microscopes (STEM), and other similar products. Their popularity arises from their ultra-high resolution, ease of use, versatility, and analysis precision.

Further explore about high-quality imaging options at Hitachi’s Electron Microscopes.

To select the best analytical solutions for your research needs, visit Hitachi High-Technologies America, Inc.

Focused Ion Beam (FIB) System

Focused Ion Beam (FIB) System

Hitachi’s focused ion beam (FIB) system utilizes cutting-edge technology to ensure accuracy and ease of operation for analytical needs. Its increased, remarkable milling precision, and high-quality, high-resolution imaging, make it a reliable choice. The FIB system enables quick and precise specimen preparation, which is critical in both the scanning and transmission-electron microscopy of semiconductors.

Discover the benefits of real-time, high-precision observation at Focused Ion Beam System by Hitachi.

Contact us at Hitachi High Technologies America, Inc. for more information about Focused Ion Beam System and other advanced imaging systems.

Atomic Force Microscopes (AFM)

Atomic Force Microscopes (AFM)

Hitachi has engineered a range of Atomic Force Microscopes (AFM) for scanning probe applications. These microscopes are highly versatile and offer their application in diverse industries. It facilitates analytical accuracy and ease of use. It can be employed for measuring general surface topography or specialized nanoparticle matter.

Be assured of precise and accurate readings with sophisticated microscopes that are available at Hitachi’s Atomic Force Microscopes (AFM).

For technical support on a variety of analytical solutions offered by Hitachi, visit Hitachi High-Technologies America, Inc.

Sample Preparation Systems

Sample Preparation Systems

IM4000 Hitachi’s Cross-Section and Flat Ion Milling presents a system designed and developed specifically for surface ion polishing. This unique ion milling system facilitates two milling configurations in a single tool, eliminating the need for two separate systems for cross-section cutting and wide-area sample surface fine polishing.

For microanalysis sample preparation systems and sample cleaners, browse Hitachi’s Sample Preparation system.

Visit Hitachi High Technologies America, Inc. for a comprehensive range of critical solutions.