Electron Microscopes and Focused Ion Beam

Electron Microscopes and Focused Ion Beam

Hitachi offers a wide range of electron microscopes, including standard and variable pressure Scanning Electron Microscopes (SEM), Transmission Electron Microscopes (TEM), Atomic Force Microscopes (AFM), sample preparation units for SEM, and TEM and Focused Ion Beam (FIB) systems. Our products are constructed to meet the most stringent requirements in material science, biological research, and industrial applications.

Analytical Systems

Analytical Systems

Hitachi is dedicated to fueling discoveries that power the evolution of society through industries like healthcare, education, agriculture and science. Our wide range of high-caliber scientific instruments include advanced Analytical Systems that are engineered to enhance precision and increase performance, thus aiding in an improved time-to-discovery.

SOCIAL INNOVATION BUSINESS

Social Innovation in Scientific Research Equipment

Hitachi adheres to the belief that social innovation is key to providing a more comfortable, healthy and convenient lifestyle. Our social innovation solutions establish protocols for success, happiness, and peaceful living.

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The TM Series: going beyond the classroom
The TM Series: going beyond the classroom
When we say the word “microscope” where do you picture one? Most likely, your mind takes you to a classroom where students utilize microscopes daily.
Understanding the Human Genome
Understanding the Human Genome
Human Chromosome Explorer bridges important gaps in the human genome.